Semiconductor devices - mechanical and climatic test methods - salt atmosphere 半导体装置.机械和气候试验方法.盐雾气氛
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Semiconductor devices - mechanical and climatic test methods - part 13 : salt atmosphere 半导体器件.机械和气候试验方法.第13部分:盐性环境
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Semiconductor devices - mechanical and climatic test methods - part 13 : salt atmosphere 半导体装置.机械和气候试验方法.第13部分:盐雾环境试验
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Semiconductor devices - mechanical and climatic test methods - part 13 : salt atmosphere iec 60749 - 13 : 2002 ; german version en 60749 - 13 : 2002 半导体器件.机械和气候试验方法.第13部分:盐雾